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Book/Report | FZJ-2016-03917 |
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1980
Kernforschungsanlage Jülich, Zentralbiliothek, Verlag
Jülich
Please use a persistent id in citations: http://hdl.handle.net/2128/11938
Report No.: Juel-1662
Abstract: This report deals with small-angle X-ray scattering as a characterization method for ceramic materials. After introducing the basic theory of small-angle scattering and its possible utilization methods, the length of intercepts is introduced and a procedure is shown to obtain this value from the scattered intensities. Using this method on four ceramic materials (graphite, graphitic matrix materials, alumina and a catalyst) it was shown which new and additional information can be obtained.
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